![]() ![]() Each element on the chart comprises three vertical bars and three horizontal bars, and the detail on these slides is as fine as 0.78microns (644 line-pairs per mm). #Zeiss siemens star chart pdf codePattern Description Order Code R67 NBS 5 Bar Test Chart, 1-18 lines per mm, 06A01093 chrome surface image on B270 glass 75mm x 75mm 3Ĥ USAF 1951 Test Charts USAF resolution charts are recognised the world over as a universal standard for testing the vertical and horizontal resolution of imaging systems. ![]() Produced as a vacuum deposited chrome image on 75mm x 75mm glass. Pattern Description Order Code R60 NBS 25 Test Chart, 3-20 lines per mm 06B01090 chrome surface image on B270 glass 50mm x 50mm NBS 5 Bar Test Chart (BS4657) This consists of elements of 5 bars ranging from 1 line per mm to 18 lines per mm, with adjacent numbers indicating the number of lines per mm. Also available in low contrast and negative form. Supplied as a positive high contrast chrome image on glass substrate 50mm x 50mm. Lines range from 3 lines per mm to 20 lines per mm. #Zeiss siemens star chart pdf seriesPattern R65 R66 Sector pitch 10º 5º Number of sectors Outside diameter of image 25mm 25mm Unresolved centre core 0.2mm 0.4mm Normal substrate B270 Glass B270 Glass Overall size 50mm x 50mm 50mm x 50mm Image type Vacuum deposited chrome Vacuum deposited chrome Order code 06B B01092 NBS 25 Resolution Test Chart A series of gratings diminishing in size as they go towards the central target. It is used qualitatively to demonstrate focussing effects, optical astigmatism and for rapid assessment of focal plane. 2ģ Star Test Target Also known as Siemens star or sunburst pattern. If the product you require is not listed, then please contact us with your requirements. All products in this catalogue are available on other materials to special order. Special products are available for testing windscreens to various International standards. In addition to these products, we also supply a specialist NPL/HSE test slide for checking the resolving power of phase contrast microscopes see part ref S84 in stage micrometers catalogue. ![]() Customers often require special charts for specific applications and these can be made to your exact requirements. Pyser-SGI manufactures a range of charts on glass and in metal foil. Ronchi rulings and grids are used to create interference patterns, to measure distortion and for MTF measurements. 2 Optical Resolution Charts, Ronchi Rulings and Grids The optical resolution charts are used to test characteristics such as resolution, contrast, distortion and modulation transfer function (MTF) of lenses, cameras and optical systems. ![]()
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